26th International Free-Electron Laser Conference (FEL 2004)Conference publication
Chemical Composition Image and Spectral Analysis by Using SNIM Technology
26th International Free-Electron Laser Conference (FEL 2004) · THPOS34, abstract book p. 199, Trieste (2004)
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Introduction
The IHEP team paired a mid-infrared free-electron laser with a scanning near-field infrared microscope. Their poster abstract reports a chemical-composition image from a mixed polyethylene–polypropylene film and a near-field reflection spectrum from gallium nitride.
A closer reading
The polymer film tests whether the instrument can map spatial differences in composition, while GaN tests whether the probe can recover a local reflection spectrum. Together they show how the same apparatus can ask where a component lies and which wavelengths a sample responds to.