Rare Metals
Rapid and nondestructive layer number identification of two‐dimensional layered transition metal dichalcogenides
Rare Metals · 36, 698-703 (2017)
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Introduction
Reflection spectra are compared for MoS₂, MoSe₂ and WSe₂ flakes on silicon with a 275 nm oxide layer. Atomic-force thickness measurements and Fresnel calculations calibrate a nondestructive way to identify monolayers and few-layer samples.
A closer reading
Testing several dichalcogenides asks whether the optical approach transfers beyond a single material. Each material has its own spectral fingerprints, so the calibrated substrate thickness remains part of the identification method.